DalsnaFinance

Covalent Expands Wafer-Level Semiconductor Characterization Through Oxford Instruments Collaboration

Markets PR Newswire By PR Newswire 04 Jun 2026 17:08 1 min read
Covalent Expands Wafer-Level Semiconductor Characterization Through Oxford Instruments Collaboration

SUNNYVALE, Calif., June 4, 2026 /PRNewswire/ -- Covalent today announced a strategic collaboration with Oxford Instruments that expands its semiconductor characterization offering with customer-ready, wafer-level Raman and photoluminescence (PL) workflows. The capability is now available...

SUNNYVALE, Calif., June 4, 2026 /PRNewswire/ -- Covalent today announced a strategic collaboration with Oxford Instruments that expands its semiconductor characterization offering with customer-ready, wafer-level Raman and photoluminescence (PL) workflows. The capability is now available...

Read the full story on PR Newswire → Opens the original article on www.prnewswire.com

Summary aggregated from PR Newswire's public RSS feed. The full reporting belongs to PR Newswire — please read it on their site.